Nov. 22 Mon.

TimeOral Track 1Oral Track 2
10:00–13:00Tutorial 1: Testing and Monitoring of Die-to-Die Interconnects in a 2.5D/3D IC
14:00–17:00Tutorial 2: Automotive Safety, Reliability, and Test Solutions

Nov. 23 Tue.

TimeOral Track 1Oral Track 2
10:30–11:30Keynote 1: Machine Learning for Serving Test Data Analytics
12:00–13:30Session 1: Hardware Oriented SecuritySession 2: Fault Tolerance & RF Test
14:00–15:30Session 3: Machine Learning & Testing FrameworkDoctoral Thesis Award
16:00–18:00Session 4: ATPG & Online TestSession 5: Simulation & Verification

Nov. 24 Wed.

TimeOral Track 1Oral Track 2
9:00–10:30Session 6: Test GenerationSession 7: Dependability
11:00–12:00Keynote 2: Fugaku Supercomputer System – Technologies to Promise its Quality and Reliability
12:30–13:30Keynote 3: Optically Efficient III-V Compound Semiconductor Nanowires on Si
14:00–15:30ATS 30th Anniversary & Announcement of the Next ATS (2022)
Part I: What we have established
Part II: Future prospective of our community. What we can do and what we should do
16:00–17:30Industry Session (16:00–17:00)High School Student Presentation

Times are JST (GMT +9:00).