Nov. 22 Mon.
| Time | Oral Track 1 | Oral Track 2 |
|---|---|---|
| 10:00–13:00 | Tutorial 1: Testing and Monitoring of Die-to-Die Interconnects in a 2.5D/3D IC | |
| 14:00–17:00 | Tutorial 2: Automotive Safety, Reliability, and Test Solutions | |
Nov. 23 Tue.
| Time | Oral Track 1 | Oral Track 2 |
|---|---|---|
| 10:00–10:30 | Opening | |
| 10:30–11:30 | Keynote 1: Machine Learning for Serving Test Data Analytics | |
| 12:00–13:30 | Session 1: Hardware Oriented Security | Session 2: Fault Tolerance & RF Test |
| 14:00–15:30 | Session 3: Machine Learning & Testing Framework | Doctoral Thesis Award |
| 16:00–18:00 | Session 4: ATPG & Online Test | Session 5: Simulation & Verification |
Nov. 24 Wed.
| Time | Oral Track 1 | Oral Track 2 |
|---|---|---|
| 9:00–10:30 | Session 6: Test Generation | Session 7: Dependability |
| 11:00–12:00 | Keynote 2: Fugaku Supercomputer System – Technologies to Promise its Quality and Reliability | |
| 12:30–13:30 | Keynote 3: Optically Efficient III-V Compound Semiconductor Nanowires on Si | |
| 14:00–15:30 | ATS 30th Anniversary & Announcement of the Next ATS (2022) Part I: What we have established Part II: Future prospective of our community. What we can do and what we should do |
|
| 16:00–17:30 | Industry Session (16:00–17:00) | High School Student Presentation |
Times are JST (GMT +9:00).